Reliability and Failure of Electronic Materials and Devices

Written By Milton Ohring
Reliability and Failure of Electronic Materials and Devices
  • Publsiher : Academic Press
  • Release : 03 November 2014
  • ISBN : 0080575528
  • Pages : 758 pages
  • Rating : 4/5 from 21 reviews
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Read or download book entitled Reliability and Failure of Electronic Materials and Devices written by Milton Ohring which was release on 03 November 2014, this book published by Academic Press. Available in PDF, EPUB and Kindle Format. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices
  • Author : Milton Ohring,Lucian Kasprzak
  • Publisher : Academic Press
  • Release Date : 2014-11-03
  • Total pages : 758
  • ISBN : 0080575528
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Summary : Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book ...

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices
  • Author : Milton Ohring,Lucian Kasprzak,James R Lloyd
  • Publisher : Academic Press
  • Release Date : 2017-11-13
  • Total pages : 750
  • ISBN : 0080575528
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Summary : "Reliability and Failure of Electronic Materials and Devices" is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book ...

Reliability and Failure of electronic Materials and Devices 2 E

Reliability and Failure of electronic Materials and Devices 2 E
  • Author : Milton Ohring
  • Publisher : Unknown
  • Release Date : 2015-04
  • Total pages : 734
  • ISBN : 0080575528
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Summary : Download or read online Reliability and Failure of electronic Materials and Devices 2 E written by Milton Ohring, published by which was released on 2015-04. Get Reliability and Failure of electronic Materials and Devices 2 E Books now! Available in PDF, ePub and Kindle....

Corrosion and Reliability of Electronic Materials and Devices

Corrosion and Reliability of Electronic Materials and Devices
  • Author : Robert B. Comizzoli,Robert Peter Frankenthal,James Douglas Sinclair
  • Publisher : The Electrochemical Society
  • Release Date : 1999
  • Total pages : 292
  • ISBN : 0080575528
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Summary : Download or read online Corrosion and Reliability of Electronic Materials and Devices written by Robert B. Comizzoli,Robert Peter Frankenthal,James Douglas Sinclair, published by The Electrochemical Society which was released on 1999. Get Corrosion and Reliability of Electronic Materials and Devices Books now! Available in PDF, ePub and Kindle....

Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization
  • Author : Dieter K. Schroder
  • Publisher : John Wiley & Sons
  • Release Date : 2006-02-10
  • Total pages : 800
  • ISBN : 0080575528
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Summary : This Third Edition updates a landmark text with thelatest findings The Third Edition of the internationally laudedSemiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist readers. Not only doesthe Third Edition set forth all the latest measurementtechniques, ...

Yield of Electronic Materials and Devices

Yield of Electronic Materials and Devices
  • Author : National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices
  • Publisher : Unknown
  • Release Date : 1972
  • Total pages : 82
  • ISBN : 0080575528
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Summary : Download or read online Yield of Electronic Materials and Devices written by National Research Council (U.S.). Ad Hoc Panel on Yield of Electronic Materials and Devices, published by which was released on 1972. Get Yield of Electronic Materials and Devices Books now! Available in PDF, ePub and Kindle....

Electronic Materials

Electronic Materials
  • Author : Yuriy M. Poplavko
  • Publisher : Elsevier
  • Release Date : 2018-11-23
  • Total pages : 707
  • ISBN : 0080575528
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Summary : Mechanical and thermal properties are reviewed and electrical and magnetic properties are emphasized. Basics of symmetry and internal structure of crystals and the main properties of metals, dielectrics, semiconductors, and magnetic materials are discussed. The theory and modern experimental data are presented, as well as the specifications of materials that ...

Physics and Technology of Thin Films

Physics and Technology of Thin Films
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 2021-12-02
  • Total pages : 212
  • ISBN : 0080575528
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Summary : Download or read online Physics and Technology of Thin Films written by , published by which was released on . Get Physics and Technology of Thin Films Books now! Available in PDF, ePub and Kindle....

Proceedings of the International Workshop on Physics and Technology of Thin Films

Proceedings of the International Workshop on Physics and Technology of Thin Films
  • Author : Alireza Zaker Moshfegh
  • Publisher : World Scientific
  • Release Date : 2004
  • Total pages : 548
  • ISBN : 0080575528
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Summary : Thin films science and technology plays an important role in the high-tech industries. Thin film technology has been developed primarily for the need of the integrated circuit industry. The demand for development of smaller and smaller devices with higher speed especially in new generation of integrated circuits requires advanced materials ...

Reliability Assessments

Reliability Assessments
  • Author : Franklin Richard Nash, Ph.D.
  • Publisher : CRC Press
  • Release Date : 2017-07-12
  • Total pages : 784
  • ISBN : 0080575528
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Summary : This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions ...

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
  • Author : Jan Stehr,Irina Buyanova,Weimin Chen
  • Publisher : Woodhead Publishing
  • Release Date : 2018-06-29
  • Total pages : 306
  • ISBN : 0080575528
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Summary : Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at ...

Electronic Thin Film Reliability

Electronic Thin Film Reliability
  • Author : King-Ning Tu
  • Publisher : Cambridge University Press
  • Release Date : 2010-11-25
  • Total pages : 212
  • ISBN : 0080575528
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Summary : Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on ...

IC Component Sockets

IC Component Sockets
  • Author : Weifeng Liu,Michael Pecht
  • Publisher : John Wiley & Sons
  • Release Date : 2004-03-25
  • Total pages : 232
  • ISBN : 0080575528
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Summary : A broad and practical reference to IC socket technology The first and only comprehensive resource on IC (Integrated Circuit) socket technology, IC Component Sockets offers a complete overview of socket technology and design in order to provide engineers and their managers with a good understanding of these specialized technologies and ...

Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices

Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices
  • Author : Robert B. Comizzoli,Robert Peter Frankenthal,James Douglas Sinclair
  • Publisher : The Electrochemical Society
  • Release Date : 1994
  • Total pages : 417
  • ISBN : 0080575528
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Summary : Download or read online Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices written by Robert B. Comizzoli,Robert Peter Frankenthal,James Douglas Sinclair, published by The Electrochemical Society which was released on 1994. Get Proceedings of the Third International Symposium on Corrosion and Reliability ...

Optical Waveguide Sensing and Imaging

Optical Waveguide Sensing and Imaging
  • Author : Wojtek J. Bock,Israel Gannot,Stoyan Tanev
  • Publisher : Springer Science & Business Media
  • Release Date : 2007-12-14
  • Total pages : 269
  • ISBN : 0080575528
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Summary : The book explores various aspects of existing and emerging fiber and waveguide optics sensing and imaging technologies including recent advances in nanobiophotonics. The focus is both on fundamental and applied research as well as on applications in civil engineering, biomedical sciences, environment, security and defence. The book aims to provide ...