Quantitative Data Processing in Scanning Probe Microscopy

Written By Petr Klapetek
Quantitative Data Processing in Scanning Probe Microscopy
  • Publsiher : Micro & Nano Technologies
  • Release : 24 January 2018
  • ISBN : 9780128133477
  • Pages : 416 pages
  • Rating : 4/5 from 21 reviews
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Read or download book entitled Quantitative Data Processing in Scanning Probe Microscopy written by Petr Klapetek which was release on 24 January 2018, this book published by Micro & Nano Technologies. Available in PDF, EPUB and Kindle Format. Book excerpt: Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http: //gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy
  • Author : Petr Klapetek
  • Publisher : Micro & Nano Technologies
  • Release Date : 2018-01-24
  • Total pages : 416
  • ISBN : 9780128133477
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Summary : Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this ...

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy
  • Author : Petr Klapetek
  • Publisher : Elsevier
  • Release Date : 2018-02-03
  • Total pages : 416
  • ISBN : 9780128133477
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Summary : Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this ...

Atomic Force Microscopy

Atomic Force Microscopy
  • Author : Bert Voigtländer
  • Publisher : Springer
  • Release Date : 2019-05-23
  • Total pages : 331
  • ISBN : 9780128133477
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Summary : This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part ...

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy
  • Author : Francesco Marinello,Daniele Passeri,Enrico Savio
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-10-04
  • Total pages : 494
  • ISBN : 9780128133477
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Summary : The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including ...

Functional Nanomaterials and Devices for Electronics Sensors and Energy Harvesting

Functional Nanomaterials and Devices for Electronics  Sensors and Energy Harvesting
  • Author : Alexei Nazarov,Francis Balestra,Valeriya Kilchytska,Denis Flandre
  • Publisher : Springer
  • Release Date : 2014-08-28
  • Total pages : 469
  • ISBN : 9780128133477
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Summary : This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is ...

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics
  • Author : Anonim
  • Publisher : Academic Press
  • Release Date : 2015-06-09
  • Total pages : 260
  • ISBN : 9780128133477
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Summary : Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image ...

Nanotechnology Standards

Nanotechnology Standards
  • Author : Vladimir Murashov,John Howard
  • Publisher : Springer Science & Business Media
  • Release Date : 2011-02-01
  • Total pages : 262
  • ISBN : 9780128133477
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Summary : Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related ...

Optical Characterization of Thin Solid Films

Optical Characterization of Thin Solid Films
  • Author : Olaf Stenzel,Miloslav Ohlídal
  • Publisher : Springer
  • Release Date : 2018-03-09
  • Total pages : 462
  • ISBN : 9780128133477
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Summary : This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international ...

MMS 2018

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  • Author : Lucia Knapčíková ,Dragan Perakovič,Michal Balog,Marko Periša
  • Publisher : European Alliance for Innovation
  • Release Date : 2018-12-04
  • Total pages : 252
  • ISBN : 9780128133477
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Summary : The conference aims at creating synergies of “practice and research” increasing the potential and commercial viability of research and development in the field of innovative technologies in management of manufacturing systems, Industry 4.0, logistics and traffic/transport system. The ambition of the MMS 2018 conference is to establish channels of communication and ...

Scanning Probe Microscopy of Soft Matter

Scanning Probe Microscopy of Soft Matter
  • Author : Vladimir V. Tsukruk,Srikanth Singamaneni
  • Publisher : John Wiley & Sons
  • Release Date : 2012-01-09
  • Total pages : 661
  • ISBN : 9780128133477
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Summary : Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on ...

Laser Induced Damage in Optical Materials

Laser Induced Damage in Optical Materials
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1995
  • Total pages : 212
  • ISBN : 9780128133477
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Summary : Download or read online Laser Induced Damage in Optical Materials written by , published by which was released on 1995. Get Laser Induced Damage in Optical Materials Books now! Available in PDF, ePub and Kindle....

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
  • Author : Bharat Bhushan
  • Publisher : Springer Science & Business Media
  • Release Date : 2010-12-17
  • Total pages : 816
  • ISBN : 9780128133477
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Summary : This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, ...

Scanning Probe Microscopy in Industrial Applications

Scanning Probe Microscopy  in Industrial Applications
  • Author : Dalia G. Yablon
  • Publisher : John Wiley & Sons
  • Release Date : 2013-10-24
  • Total pages : 368
  • ISBN : 9780128133477
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Summary : Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn ...

Atomic Force Microscopy Scanning Tunneling Microscopy

Atomic Force Microscopy Scanning Tunneling Microscopy
  • Author : M.T. Bray,Samuel H. Cohen,Marcia L. Lightbody
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-11-11
  • Total pages : 454
  • ISBN : 9780128133477
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Summary : The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists ...

Green Synthesis of Nanomaterials for Bioenergy Applications

Green Synthesis of Nanomaterials for Bioenergy Applications
  • Author : Neha Srivastava,Manish Srivastava,P. K. Mishra,Vijai Kumar Gupta
  • Publisher : John Wiley & Sons
  • Release Date : 2020-08-26
  • Total pages : 272
  • ISBN : 9780128133477
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Summary : An authoritative summary of the quest for an environmentally sustainable synthesis process of nanomaterials and their application for environmental sustainability Green Synthesis of Nanomaterials for Bioenergy Applications is an important guide that provides information on the fabrication of nanomaterial and the application of low cost, green methods. The book also ...